Failure Analysis: High Technology Devices (de Gruyter Stem)

Daniel J. D. Sullivan, Eric J. Carleton

$86.99

Publication Date: October 24th, 2022

Publisher:

de Gruyter

ISBN:

9781501524783

Pages:

128

Usually Ships in 1 to 5 Days

Description

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

About the Author

Dr. Daniel J. D. Sullivan attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection. Dr. Eric J. Carleton is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.

Failure Analysis: High Technology Devices (de Gruyter Stem)

Description

About the Author

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